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Detection and Prediction of Errors in EPCs of the SAP Reference Model

Mendling, Jan, Verbeek, Eric, van Dongen, Boudewijn, van der Aalst, Wil M., & Neumann, Gustaf (2008) Detection and Prediction of Errors in EPCs of the SAP Reference Model. Data and Knowledge Engineering, 64(1), pp. 312-329.

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Abstract

Up to now there is neither data available on how many errors can be expected in process model collections, nor is it understood why errors are introduced. In this article, we provide empirical evidence for these questions based on the SAP reference model. This model collection contains about 600 process models expressed as Event-driven Process Chains (EPCs). We translated these EPCs into YAWL models, and analyzed them using the verification tool WofYAWL. We discovered that at least 34 of these EPCs contain errors. Moreover, we used logistic regression to show that complexity of EPCs has a significant impact on error probability.

Impact and interest:

63 citations in Scopus
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41 citations in Web of Science®

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189 since deposited on 03 Jul 2008
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ID Code: 13959
Item Type: Journal Article
Keywords: Business Process Management, Verification, Event, driven Process Chains, YAWL, Error Prediction, Logistic Regression
DOI: 10.1016/j.datak.2007.06.019
ISSN: 0169-023X
Subjects: Australian and New Zealand Standard Research Classification > INFORMATION AND COMPUTING SCIENCES (080000) > INFORMATION SYSTEMS (080600) > Information Systems Development Methodologies (080608)
Divisions: Past > QUT Faculties & Divisions > Faculty of Science and Technology
Copyright Owner: Copyright 2008 Elsevier
Copyright Statement: Reproduced in accordance with the copyright policy of the publisher.
Deposited On: 03 Jul 2008
Last Modified: 29 Feb 2012 23:33

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