Security metrics for object-oriented class designs
Alshammari, Bandar, Fidge, Colin J., & Corney, Diane (2009) Security metrics for object-oriented class designs. In Choi, Byoungju (Ed.) Proceeding of QSIC 2009 : Ninth International Conference on Quality Software, 24-25 August, Jeju, Korea.
Measuring quality attributes of object-oriented designs (e.g. maintainability and performance) has been covered by a number of studies. However, these studies have not considered security as much as other quality attributes. Also, most security studies focus at the level of individual program statements. This approach makes it hard and expensive to discover and fix vulnerabilities caused by design errors. In this work, we focus on the security design of an object oriented application and define a number of security metrics. These metrics allow designers to discover and fix security vulnerabilities at an early stage, and help compare the security of various alternative designs. In particular, we propose seven security metrics to measure Data Encapsulation (accessibility) and Cohesion (interactions) of a given object-oriented class from the point of view of potential information flow.
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|Item Type:||Conference Paper|
|Keywords:||Software Quality, Software Security, Software Metrics, Design Principles, Refactoring|
|Subjects:||Australian and New Zealand Standard Research Classification > INFORMATION AND COMPUTING SCIENCES (080000) > COMPUTER SOFTWARE (080300) > Software Engineering (080309)|
|Divisions:||Past > QUT Faculties & Divisions > Faculty of Science and Technology
Past > Institutes > Information Security Institute
|Copyright Owner:||Copyright 2009 The Institute of Electrical and Electronics Engineers|
|Copyright Statement:||Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Deposited On:||11 Oct 2009 23:19|
|Last Modified:||22 Jul 2014 05:13|
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