X-ray your data with Rasch
Curtis, David & Boman, Peter (2007) X-ray your data with Rasch. International Education Journal, 8(2), pp. 249-259.
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By using the Rasch model, much detailed diagnostic information is available to developers of survey and assessment instruments and to the researchers who use them. We outline an approach to the analysis of data obtained from the administration of survey instruments that can enable researchers to recognise and diagnose difficulties with those instruments and then to suggest remedial actions that can improve the measurement properties of the scales included in questionnaires. We illustrate the approach using examples drawn from recent research and demonstrate how the approach can be used to generate figures that make the results of Rasch analyses accessible to non-specialists.
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|Item Type:||Journal Article|
|Keywords:||Rasch, Partial Credit Model, Reliability, Threshold Analysis, Differential Item Function|
|Subjects:||Australian and New Zealand Standard Research Classification > EDUCATION (130000) > SPECIALIST STUDIES IN EDUCATION (130300) > Education Assessment and Evaluation (130303)|
|Divisions:||Current > Research Centres > Office of Education Research
Current > Schools > School of Cultural & Professional Learning
Current > QUT Faculties and Divisions > Faculty of Education
|Copyright Owner:||Copyright 2007 Shannon Research Press|
|Deposited On:||27 Nov 2009 01:55|
|Last Modified:||25 Mar 2013 08:20|
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