Characterization of electron trapping in dye-sensitized solar cells by near-IR transmittance measurements
Nguyen, T.T. Oanh, Peter, Laurence M., & Wang, Hongxia (2009) Characterization of electron trapping in dye-sensitized solar cells by near-IR transmittance measurements. Journal of Physical Chemistry Part C, 113(19), pp. 8532-8536.
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In situ near-IR transmittance measurements have been used to characterize the density of trapped electrons in dye-sensitized solar cells (DSCs). Measurements have been made under a range experimental conditions including during open circuit photovoltage decay and during recording of the IV characteristic. The optical cross section of electrons at 940 nm was determined by relating the IR absorbance to the density of trapped electrons measured by charge extraction. The value, σn = 5.4 × 10-18 cm2, was used to compare the trapped electron densities in illuminated DSCs under open and short circuit conditions in order to quantify the difference in the quasi Fermi level, nEF. It was found that nEF for the cells studied was 250 meV over wide range of illuminat on intensities. IR transmittance measurements have also been used to quantify shifts in conduction band energy associated with dye adsorption.
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|Item Type:||Journal Article|
|Additional Information:||This article is freely available from the American Chemical Society website 12 months after the publication date. See links to publisher website in this record.|
|Keywords:||Dye-sensitized, Solar Cell, Trapping/detrapping|
|Subjects:||Australian and New Zealand Standard Research Classification > CHEMICAL SCIENCE (030000) > PHYSICAL CHEMISTRY (INCL. STRUCTURAL) (030600) > Transport Properties and Non-Equilibrium Processes (030607)
Australian and New Zealand Standard Research Classification > ENGINEERING (090000) > ELECTRICAL AND ELECTRONIC ENGINEERING (090600) > Photodetectors Optical Sensors and Solar Cells (090605)
|Divisions:||Past > QUT Faculties & Divisions > Faculty of Built Environment and Engineering
Past > Schools > School of Engineering Systems
|Copyright Owner:||Copyright 2009 American Chemical Society|
|Deposited On:||29 Apr 2010 02:30|
|Last Modified:||29 Feb 2012 14:10|
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