Low-temperature analyses in the analytical electron microscope
Mackinnon, Ian D.R. (1990) Low-temperature analyses in the analytical electron microscope. In Mackinnon, Ian D.R. & Mumpton, F.R. (Eds.) Electron-optical Methods in Clay Science. The Clay Minerals Society, Evergreen, CO, Chantilly, VA, pp. 90-106.
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|Item Type:||Book Chapter|
|Additional Information:||GeoRef, Copyright 2009, American Geological Institute.
|Keywords:||chemical analysis, clay minerals, electron microscopy, low temperature, sample preparation, scanning electron microscopy, sheet silicates, temperature, universal stage|
|Subjects:||Australian and New Zealand Standard Research Classification > EARTH SCIENCES (040000) > GEOLOGY (040300) > Mineralogy and Crystallography (040306)|
|Divisions:||Current > Institutes > Institute for Future Environments|
|Deposited On:||22 Jan 2013 22:22|
|Last Modified:||22 Jan 2013 22:25|
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