Low-temperature analyses in the analytical electron microscope

Mackinnon, Ian D.R. (1990) Low-temperature analyses in the analytical electron microscope. In Mackinnon, Ian D.R. & Mumpton, F.R. (Eds.) Electron-optical Methods in Clay Science. The Clay Minerals Society, Evergreen, CO, Chantilly, VA, pp. 90-106.

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ID Code: 55683
Item Type: Book Chapter
Additional Information: GeoRef, Copyright 2009, American Geological Institute.
1995-011528
Keywords: chemical analysis, clay minerals, electron microscopy, low temperature, sample preparation, scanning electron microscopy, sheet silicates, temperature, universal stage
ISSN: 1521-740X
Subjects: Australian and New Zealand Standard Research Classification > EARTH SCIENCES (040000) > GEOLOGY (040300) > Mineralogy and Crystallography (040306)
Divisions: Current > Institutes > Institute for Future Environments
Deposited On: 22 Jan 2013 22:22
Last Modified: 22 Jan 2013 22:25

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