Microstructural investigation of Bi-Sr-Ca-Cu-oxide thick films on alumina substrates

Alarco, J.A., Ilushechkin, A., Yamashita, T., Bhargava, A., Barry, J.C., & Mackinnon, I.D.R. (1997) Microstructural investigation of Bi-Sr-Ca-Cu-oxide thick films on alumina substrates. Journal of Materials Science, 32(14), pp. 3759-3764.

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Abstract

The microstructure of Bi-Sr-Ca-Cu-oxide (BSCCO) thick films on alumina substrates has been characterized using a combination of X-ray diffractometry, scanning electron microscopy, transmission electron microscopy of sections across the film/substrate interface and energy-dispersive X-ray spectrometry. A reaction layer formed between the BSCCO films and the alumina substrates. This chemical interaction is largely responsible for off-stoichiometry of the films and is more significant after partial melting of the films. A new phase with fee structure, lattice parameter a = 2.45 nm and approximate composition Al3Sr2CaBi2CuOx has been identified as reaction product between BSCCO and Al2O3.

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ID Code: 57468
Item Type: Journal Article
Refereed: Yes
Additional Information: ISI Document Delivery No.: XM074
Times Cited: 6
Cited Reference Count: 10
Alarco, JA Ilushechkin, A Yamashita, T Bhargava, A Barry, J Mackinnon, IDR
Chapman hall ltd
London
Keywords: XRD, electron microscopy, high temperature superconductor, Bismuth copper oxide, microstructure
DOI: 10.1023/a:1018667405370
ISSN: 0022-2461
Subjects: Australian and New Zealand Standard Research Classification > ENGINEERING (090000) > MATERIALS ENGINEERING (091200) > Ceramics (091201)
Australian and New Zealand Standard Research Classification > ENGINEERING (090000) > MATERIALS ENGINEERING (091200) > Functional Materials (091205)
Divisions: Current > Schools > School of Chemistry, Physics & Mechanical Engineering
Current > Institutes > Institute for Future Environments
Current > QUT Faculties and Divisions > Science & Engineering Faculty
Deposited On: 27 Feb 2013 03:40
Last Modified: 27 Feb 2013 03:40

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