Oxide reduction in NiO-containing solid solution systems during transmission electron microscopy
Davies, Peter K. & Mackinnon, Ian D.R. (1986) Oxide reduction in NiO-containing solid solution systems during transmission electron microscopy. Journal of the American Ceramic Society, 69(6), c. 124-c. 125.
The effects of electron irradiation on NiO-containing solid solution systems are described. Partially hydrated NiO solid solutions, e. g. , NiO-MgO, undergo surface reduction to Ni metal after examination by TEM. This surface layer results in the formation of Moire interference patterns.
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|Item Type:||Journal Article|
|Additional Information:||Cited By (since 1996): 3
Export Date: 19 February 2013
Language of Original Document: English
Correspondence Address: Davies, Peter K.; Univ of Pennsylvania, Philadelphia,, PA, USA, Univ of Pennsylvania, Philadelphia, PA, USA
|Keywords:||CERAMIC MATERIALS - Surfaces, MATERIALS SCIENCE - Radiation Effects, CUBIC MATRIX, DOMAIN FORMATION, HIGH-ENERGY BOMBARDMENT, HIGH-VACUUM EFFECTS, NICKEL COMPOUNDS|
|Subjects:||Australian and New Zealand Standard Research Classification > CHEMICAL SCIENCE (030000) > MACROMOLECULAR AND MATERIALS CHEMISTRY (030300)
Australian and New Zealand Standard Research Classification > ENGINEERING (090000) > MATERIALS ENGINEERING (091200) > Ceramics (091201)
|Divisions:||Current > Institutes > Institute for Future Environments|
|Deposited On:||25 Feb 2013 01:13|
|Last Modified:||25 Feb 2013 01:13|
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