A comparison of calculated and experimental HRTEM images of twinned boron carbide
Miller, Mark L. & Mackinnon, Ian D.R. (1987) A comparison of calculated and experimental HRTEM images of twinned boron carbide. In Aselage, T., Emin, D., & Wood, C. (Eds.) Novel Refractory Semiconductors, Cambridge University Press, Anaheim, CA, pp. 133-138.
High resolution TEM images of boron carbide (B13C2) have been recorded and compared with images calculated using the multislice method as implemented by M. A. O'Keefe in the SHRLI programs. Images calculated for the  zone, using machine parameters for the JEOL 2000FX AEM operating at 200 keV, indicate that for the structure model of Will et al., the optimum defocus image can be interpreted such that white spots correspond to B12 icosahedra for thin specimens and to low density channels through the structure adjacent to the direct inter-icosahedral bonds for specimens of intermediate thickness (-40 > t > -100 nm). With this information, and from the symmetry observed in the TEM images, it is likely that the (101) twin plane passes through the center of icosahedron located at the origin. This model was tested using the method of periodic continuation. Resulting images compare favorably with experimental images, thus supporting the structural model. The introduction of a (101) twin plane through the origin creates distortions to the icosahedral linkages as well as to the intra-icosahedral bonding. This increases the inequivalence of adjacent icosahedral sites along the twin plane, and thereby increases the likelihood of bipolaron hopping.
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|Item Type:||Conference Paper|
|Keywords:||boron carbide, HRTEM images, image calculation, twinning, bipolaron hopping|
|Subjects:||Australian and New Zealand Standard Research Classification > ENGINEERING (090000) > MATERIALS ENGINEERING (091200) > Ceramics (091201)
Australian and New Zealand Standard Research Classification > ENGINEERING (090000) > MATERIALS ENGINEERING (091200) > Compound Semiconductors (091203)
|Divisions:||Current > Institutes > Institute for Future Environments|
|Deposited On:||04 Mar 2013 22:43|
|Last Modified:||04 Mar 2013 22:43|
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