Thin-film analyses of silicate standards at 200 kv : the effect of temperature on element loss

Mackinnon, I.D.R., Lumpkin, G.R., & Van Deusen, S.B. (1986) Thin-film analyses of silicate standards at 200 kv : the effect of temperature on element loss. In Romig Jr., A.D. & Chambers, W.F. (Eds.) Microbeam Analysis - 1986, San Francisco Press Inc, Albuquerque, NM, pp. 451-454.

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Preliminary data is presented on a detailed statistical analysis of k-factor determination for a single class of minerals (amphiboles) which contain a wide range of element concentrations. These amphiboles are homogeneous, contain few (if any) subsolidus microstructures and can be readily prepared for thin film analysis. In previous studies, element loss during the period of irradiation has been assumed negligible for the determination of k-factors. Since this phenomena may be significant for certain mineral systems, we also report on the effect of temperature on k-factor determination for various elements using small probe sizes (approx.20 nm).

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ID Code: 57751
Item Type: Conference Paper
Refereed: Yes
Keywords: electron microscopy, amphiboles, k-factor, thin film analysis, analytical electron microscopy
Subjects: Australian and New Zealand Standard Research Classification > EARTH SCIENCES (040000) > GEOLOGY (040300) > Mineralogy and Crystallography (040306)
Divisions: Current > Institutes > Institute for Future Environments
Deposited On: 04 Mar 2013 22:18
Last Modified: 04 Mar 2013 22:18

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