Dependence of residual amplitude noise in electro-optic phase modulators on the intensity distribution of the incident field
Sathian, Juna & Jaatinen, Esa (2013) Dependence of residual amplitude noise in electro-optic phase modulators on the intensity distribution of the incident field. Journal of Optics, 15(12), pp. 125713-125718.
Our results demonstrate that photorefractive residual amplitude modulation (RAM) noise in electro-optic modulators (EOMs) can be reduced by modifying the incident beam intensity distribution. Here we report an order of magnitude reduction in RAM when beams with uniform intensity (flat-top) profiles, generated with an LCOS-SLM, are used instead of the usual fundamental Gaussian mode (TEM00). RAM arises from the photorefractive amplified scatter noise off the defects and impurities within the crystal. A reduction in RAM is observed with increasing intensity uniformity (flatness), which is attributed to a reduction in space charge field on the beam axis. The level of RAM reduction that can be achieved is physically limited by clipping at EOM apertures, with the observed results agreeing well with a simple model. These results are particularly important in applications where the reduction of residual amplitude modulation to 10^-6 is essential.
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|Item Type:||Journal Article|
|Keywords:||photorefractive effect, spatial light modulator, lithium niobate, electro-optic modulator|
|Subjects:||Australian and New Zealand Standard Research Classification > PHYSICAL SCIENCES (020000) > OPTICAL PHYSICS (020500) > Nonlinear Optics and Spectroscopy (020503)
Australian and New Zealand Standard Research Classification > PHYSICAL SCIENCES (020000) > OPTICAL PHYSICS (020500) > Photonics Optoelectronics and Optical Communications (020504)
|Divisions:||Current > Schools > School of Chemistry, Physics & Mechanical Engineering
Current > QUT Faculties and Divisions > Science & Engineering Faculty
|Copyright Owner:||Copyright 2013 Institute of Physics|
|Copyright Statement:||This is an author-created, un-copyedited version of an article accepted for publication in the Journal of Optics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/2040-8978/15/12/125713.|
|Deposited On:||28 Oct 2013 01:51|
|Last Modified:||01 Nov 2014 20:02|
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