YBCO thin films on Yttria stabilized Zirconia and LaAlO3-growth and properties

Alarco, J. A., Brorsson, G., Claeson, T., Ivanov, Z. G., Löfgren, M., & Nilsson, P. Å. (1991) YBCO thin films on Yttria stabilized Zirconia and LaAlO3-growth and properties. Physica C: Superconductivity and its Applications, 185-189(Part 3), pp. 2017-2018.

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Abstract

Laser deposition was used to deposit YBaCuO thin films on Yttria-stabilized Zirconia substrates, at substrate holder temperatures of 710-765 °C. We observed a transition from singlecrystalline to polycrystalline growth at a temperature of ∼750 °C. All films were highly c-axis oriented and had critical temperatures between 89.5 and 92 K. In the twinned singlecrystalline films, the lowest measured microwave surface resistance was 0.37 mΩ at 4.2 K and 21.5 GHz, and the highest critical current 5×106 A/cm2 at 77 K. The polycrystalline films had up to a factor of 50 higher surface resistance and a factor of 10 lower critical current. A meander line resonator made of a film on a LaAlO3 substrate, showed a microwave surface resistance of 5μΩ at 4.2 K and 2.5 GHz. © 1991.

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ID Code: 63995
Item Type: Journal Article
Refereed: Yes
Keywords: Ceramic Materials, Crystals - Growing, Yttrium Compounds, Zirconia, Oxide Superconductors, Yttrium Barium Copper Oxides, High Temperature Superconductors
DOI: 10.1016/0921-4534(91)91133-O
ISSN: 09214534
Divisions: Current > Schools > School of Chemistry, Physics & Mechanical Engineering
Current > Institutes > Institute for Future Environments
Current > QUT Faculties and Divisions > Science & Engineering Faculty
Deposited On: 06 Nov 2013 23:26
Last Modified: 06 Nov 2013 23:26

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