Microstructure and properties of artificial grain boundaries in epitaxial YBA2Cu3O7-δ thin films grown on  tilt YZrO2 bicrystals
Alarco, J. A., Olsson, E., Ivanov, Z. G., Winkler, D., Stepantsov, E. A., Lebedev, O. I., Vasiliev, A. L., Tzalenchuk, A. Ya., & Kiselev, N. A. (1995) Microstructure and properties of artificial grain boundaries in epitaxial YBA2Cu3O7-δ thin films grown on  tilt YZrO2 bicrystals. Physica C: Superconductivity and its Applications, 247(3-4), pp. 263-279.
The microstructure of artificial grain boundaries in YBa2Cu3O7-δ (YBCO) thin films grown on  tilt YZrO2 (YSZ) bicrystal substrates has been characterized using transmission electron microscopy and atomic force microscopy. Despite a relatively straight morphology of the substrate boundaries, the film boundaries were wavy. The waviness was a result of the combined effects of grooving at the substrate boundaries prior to the film deposition and an island-growth mechanism for YBCO on YSZ substrates. The dihedral angle of the groove walls varied with the misorientation angle and depended on the symmetry of the substrate boundary. The amplitudes of the film boundary waviness compared well with the widths of the grooves. In addition, the grooves induced local bending of the YBCO lattice planes and additional tilt components perpendicular to the c-axis close to the film boundaries. © 1995.
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|Item Type:||Journal Article|
|Keywords:||Atomic force microscopy, Crystal lattices, Crystals, Film growth, Grain boundaries, Microstructure, Oxide superconductors, Substrates, Transmission electron microscopy, Transport properties, Yttrium compounds, Zirconia, Artificial grain boundaries, Bicrystal substrates, Dihedral angle, Substrate boundaries, Yttrium stabilized zirconia, Superconducting films|
|Divisions:||Current > Institutes > Institute for Future Environments
Current > QUT Faculties and Divisions > Science & Engineering Faculty
|Deposited On:||07 Nov 2013 00:29|
|Last Modified:||07 Nov 2013 00:29|
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