Microstructure of epitaxial YBa2Cu3O7-δ thin films on (001)-tilt Y-ZrO2 bicrystals
Alarco, J.A., Olsson, E., Ivanov, Z.G., Winkler, D., Claeson, T., Stepantsov, E.A., Lebedev, O.I., Vasiliev, A., & Kiselev, N.A. (1994) Microstructure of epitaxial YBa2Cu3O7-δ thin films on (001)-tilt Y-ZrO2 bicrystals. Editions de Physique.
The microstructures of the grain boundaries in epitaxial YBa2Cu3O7-δ thin films grown on -tilt yttria-stabilized ZrO2 bicrystal substrates were characterized by TEM and at. force microscopy. The exact boundary plane geometries of the bicrystal substrates were not transferred to the films which instead had wiggling grain boundaries. [on SciFinder(R)]
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|Additional Information:||CAPLUS AN 1996:302230(Conference)|
|Keywords:||grain boundary barium yttrium cuprate zirconia, microstructure barium yttrium cuprate yttria zirconia|
|Divisions:||Current > Institutes > Institute for Future Environments|
|Deposited On:||06 Nov 2013 22:52|
|Last Modified:||21 Aug 2016 16:11|
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