Ge–Si intermixing in Ge nanostructures on Si(111): an XAFS versus STM study
Motta, Nunzio, Boscherini, Federico, Sgarlata, Anna, Balzarotti, Adalberto, Ratto, Fulvio, & Rosei, Federico (2007) Ge–Si intermixing in Ge nanostructures on Si(111): an XAFS versus STM study. Physical Review B (Condensed Matter and Materials Physics), 75, pp. 1-9.
We report a detailed investigation of interdiffusion processes that occur during the growth of Germanium nanostructures on the (111)–oriented surface of Silicon. In particular, X–Ray Absorption Fine Structure (XAFS) measurements performed ex situ show that a Ge1-xSix alloy forms during deposition, with average composition x varying between 0.25 and 0.50, depending on substrate temperature and total coverage. By fitting the Ge nearest neighbor numbers around Si as a function of the deposited thickness with a simple model, the effective vertical composition profile in the growth direction has been estimated. The latter has been described with a static effective diffusion length of (10.0±1.5) nm at 530 degrees Celsius and (5±1) nm at 450 degrees Celsius, which is interpreted as the dominance of surface transport processes in the intermixing dynamics. The analysis of the data on Ge-Ge bond length indicates a decrease of the Ge–Ge atomic distances with increasing Ge fraction, confirming previous theoretical predictions for strained epilayers. The XAFS results are compared to morphological information obtained by Scanning Tunneling Microscopy investigations carried out in situ, yielding a satisfactory description for the epitaxy of this system.
Impact and interest:
Citation counts are sourced monthly from and citation databases.
These databases contain citations from different subsets of available publications and different time periods and thus the citation count from each is usually different. Some works are not in either database and no count is displayed. Scopus includes citations from articles published in 1996 onwards, and Web of Science® generally from 1980 onwards.
Citations counts from theindexing service can be viewed at the linked Google Scholar™ search.
Full-text downloads displays the total number of times this work’s files (e.g., a PDF) have been downloaded from QUT ePrints as well as the number of downloads in the previous 365 days. The count includes downloads for all files if a work has more than one.
|Item Type:||Journal Article|
|Keywords:||Ge, Si, Epitaxy, Intermixing, XAFS, STM|
|Subjects:||Australian and New Zealand Standard Research Classification > PHYSICAL SCIENCES (020000) > CONDENSED MATTER PHYSICS (020400) > Surfaces and Structural Properties of Condensed Matter (020406)|
|Divisions:||Past > QUT Faculties & Divisions > Faculty of Built Environment and Engineering|
|Copyright Owner:||Copyright 2007 American Physical Society|
|Copyright Statement:||Reproduced in accordance with the copyright policy of the publisher.|
|Deposited On:||16 Mar 2007|
|Last Modified:||29 Feb 2012 13:40|
Repository Staff Only: item control page