Automatic pupillometry from digital images

Iskander, D. Robert, Collins, Michael J., Mioschek, Siggie, & Trunk, Martin (2004) Automatic pupillometry from digital images. IEEE Transactions on Biomedical Engineering, 51(9), pp. 1619-1627.

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Abstract

Determination of two-dimensional characteristics of the anterior surface of the eye is becoming increasingly important in modern optometry and ophthalmology practice. In particular, accurate estimation of the pupil size and centration is crucial in customized refractive surgery, corneal transplantation, and advanced contact lens fitting. The pupil parameters change under different lighting conditions so they often need to be related to some fixed reference such as the limbus outline. However, current commercial pupillometers do not estimate limbus position. We present a novel algorithm for automatic extraction of pupil parameters from digital images that takes the relative limbus information into account. The algorithm utilizes several customized image processing techniques that form a robust procedure which performs well for a wide range of clinical images. We apply the developed algorithm to images obtained by a standard digital camera, and specialized ophthalmic instruments such as a wavefront sensor and a high-speed imaging system.

Impact and interest:

30 citations in Scopus
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21 citations in Web of Science®

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901 since deposited on 02 Mar 2005
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ID Code: 758
Item Type: Journal Article
Refereed: Yes
Keywords: Eye biometrics, limbus, pupil
DOI: 10.1109/TBME.2004.827546
ISSN: 0018-9294
Divisions: Past > QUT Faculties & Divisions > Faculty of Built Environment and Engineering
Current > QUT Faculties and Divisions > Faculty of Health
Copyright Owner: Copyright 2004 IEEE
Copyright Statement: Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Deposited On: 02 Mar 2005 00:00
Last Modified: 29 Feb 2012 13:09

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