Automated power semiconductor switching performance feature extraction from experimental double-pulse waveform data

Broadmeadow, Mark A.H., Walker, Geoffrey R., & Ledwich, Gerard F. (2014) Automated power semiconductor switching performance feature extraction from experimental double-pulse waveform data. In Australasian Universities Power Engineering Conference (AUPEC 2014), 28 September - 1 October 2014, Curtin University, Perth, WA.


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Double-pulse tests are commonly used as a method for assessing the switching performance of power semiconductor switches in a clamped inductive switching application. Data generated from these tests are typically in the form of sampled waveform data captured using an oscilloscope. In cases where it is of interest to explore a multi-dimensional parameter space and corresponding result space it is necessary to reduce the data into key performance metrics via feature extraction. This paper presents techniques for the extraction of switching performance metrics from sampled double-pulse waveform data. The reported techniques are applied to experimental data from characterisation of a cascode gate drive circuit applied to power MOSFETs.

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ID Code: 78594
Item Type: Conference Paper
Refereed: Yes
Keywords: Feature extraction, Measurement, Power MOSFETs, Switching circuits
DOI: 10.1109/AUPEC.2014.6966558
Divisions: Current > Schools > School of Electrical Engineering & Computer Science
Current > QUT Faculties and Divisions > Science & Engineering Faculty
Deposited On: 12 Nov 2014 00:45
Last Modified: 10 Dec 2014 03:53

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