The role of tunnel junction resistances and defects on electron transport mechanism in networks of two-dimensional disordered conductors

Yajadda, M.M.A., Kumar, S., & Ostrikov, K. (2014) The role of tunnel junction resistances and defects on electron transport mechanism in networks of two-dimensional disordered conductors. Physica E: Low-Dimensional Systems and Nanostructures, pp. 87-94.

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Abstract

The effect of tunnel junction resistances on the electronic property and the magneto-resistance of few-layer graphene sheet networks is investigated. By decreasing the tunnel junction resistances, transition from strong localization to weak localization occurs and magneto-resistance changes from positive to negative. It is shown that the positive magneto-resistance is due to Zeeman splitting of the electronic states at the Fermi level as it changes with the bias voltage. As the tunnel junction resistances decrease, the network resistance is well described by 2D weak localization model. Sensitivity of the magneto-resistance to the bias voltage becomes negligible and diminishes with increasing temperature. It is shown 2D weak localization effect mainly occurs inside of the few-layer graphene sheets and the minimum temperature of 5 K in our experiments is not sufficiently low to allow us to observe 2D weak localization effect of the networks as it occurs in 2D disordered metal films. Furthermore, defects inside the few-layer graphene sheets have negligible effect on the resistance of the networks which have small tunnel junction resistances between few-layer graphene sheets

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2 citations in Web of Science®

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ID Code: 88495
Item Type: Journal Article
Refereed: Yes
Keywords: Tunnel junctionresistance, 2D weaklocalizationeffect, 2D disorderednetworks, Coulomb blockadeeffect, Defective2Dconductors, Graphene
DOI: 10.1016/j.physe.2014.07.001
ISSN: 1386-9477
Divisions: Current > Schools > School of Chemistry, Physics & Mechanical Engineering
Current > QUT Faculties and Divisions > Science & Engineering Faculty
Deposited On: 20 Oct 2015 01:28
Last Modified: 27 Oct 2015 03:37

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