Depth profiling by microspectroscopy
Fredericks, Peter M. (2007) Depth profiling by microspectroscopy. In Everall, Neil J., Chalmers, John M., & Griffith, Peter R. (Eds.) Vibrational Spectroscopy of Polymers: Principles and Practice. John Wiley and Sons Ltd, Chichester, pp. 179-200.
Depth profiling has become an important application of the vibrational microspectroscopy of heterogeneous solid samples. This chapter discusses the experimental and theoretical aspects of depth profiling by both infrared and Raman spectroscopy. Various means, such as microtoming, exist to prepare the sample for analysis. Such methods are destructive but require only a small amount of sample. Infrared spectroscopy is restricted to destructive approaches, except for the ATR technique where limited depth profiling is possible using different internal reflection elements. Raman microspectroscopy can be used in the same way as IR and has the benefit of much better spatial resolution. However, if the Raman microspectrometer is operated in confocal mode it is also possible, without any sample preparation, for spectra to be collected from within the sample, a process known as “optical slicing”. While there have been some reports demonstrating the efficacy of this approach, there have also been warnings relating to the accuracy of the method. The latest experimental and theoretical studies are discussed in order to define the current state-of-the-art in confocal Raman depth profiling.
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|Item Type:||Book Chapter|
|Additional Information:||For more information, please refer to the publisher’s website (see hypertext link) or contact the author.
Author contact details: firstname.lastname@example.org
|Keywords:||microspectroscopy, infrared, Raman, depth profiling, attenuated total reflectance, microtome, confocal, optical slicing|
|Divisions:||Past > QUT Faculties & Divisions > Faculty of Science and Technology|
|Copyright Owner:||Copyright 2007 John Wiley and Sons Ltd|
|Deposited On:||10 Aug 2007 00:00|
|Last Modified:||29 Feb 2012 13:40|
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