Water migration in degraded XLPE cables
Oyegoke, Bolarin S., Birtwhistle, David, Lyall, James S., & Saha, Tapan Kumar (2006) Water migration in degraded XLPE cables. In Sauers, I. (Ed.) 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena, 15-18 October 2006, Kansas City, Missouri, USA.
During dielectric response measurements on samples of XLPE 22 kV cable that were known to have been severely-degraded in service by water trees, it was observed that the insulation of the cable appeared to degrade considerably after water-immersed cable sample were connected to the rated voltage AC supply. This paper describes results of systematic experiments made to investigate this factor further using polarisation and depolarisation current (PDC) equipment to measure the condition of cable samples. It is found that the cable condition appears to improve from poor to good condition within a few days after short circuiting of the previously-energised cable commenced. Conversely it is found that the condition of the cable appears to degenerate over time following re-application of the rated voltage to the cable samples. It is hypothesised that electrostatic forces maintain moisture in the trees during energisation and that the moisture retreats from the trees when the supply voltage is removed. The implication of this phenomenon on dielectric response measurements is discussed in the paper.
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|Item Type:||Conference Paper|
|Keywords:||XLPE insulation, cable insulation, electric strength, 22 kV, degraded XLPE cables, depolarisation current, dielectric response measurements, electrostatic forces, polarisation current, water migration, water, immersed cable sample|
|Divisions:||Past > QUT Faculties & Divisions > Faculty of Built Environment and Engineering|
|Copyright Owner:||Copyright 2006 IEEE|
|Copyright Statement:||Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Deposited On:||30 Aug 2007 00:00|
|Last Modified:||10 Aug 2011 17:13|
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