Simultaneous measurement of pole figure and residual stress for polycrystalline thin films - ω-φ' compensated GID in side-inclination mode

A new GID (Grazing Incident Diffraction) measurement geometry between in-plane and out-plane is proposed. It is improved from the previous ω-φ compensated GID in side-inclination mode for measurement of residual stress in polycrystalline thin films (Wang & van Riessen, 2018). Instead of keeping the constant azimuthal direction of the incident beam on thin film sample, the current proposed variation maintains a constant azimuthal direction of the scattering vector projection on the thin film sample. The variation is named as “ω-φ' compensated GID in side-inclination mode”, which enables d-spacing measurements along the same azimuthal direction. An Excel spreadsheet is attached for readers to plan the measurement and to calculate the residual stress for the planned sample azimuthal direction. Anisotropic residual stresses of a polycrystalline NiFe thin film on Si 001 substrate are measured by combining this method with Phi rotations. Highly automatic data analyses templates are developed using DIFFRAC.TOPAS v7 launch mode to calculate residual stress for all planned azimuthal directions sequentially. A pole figure file in simple text format is also generated from the same dataset using DIFFRAC.TOPAS v7 launch mode, and can be directly imported into DIFFRAC.TEXTURE v4.1 for further texture analysis. Corrections for the incident beam refraction have been implemented in both data analyses models.